General information:
Code:
UBPJO-176
Name:
Advanced methods of surface and thin films analysis
Profile of education:
Academic (A)
Lecture language:
English
Semester:
Spring
Responsible teacher:
dr hab. inż. Jedliński Jerzy (jedlinsk@agh.edu.pl)
Academic teachers:
dr hab. inż. Jedliński Jerzy (jedlinsk@agh.edu.pl)
dr hab. inż. Nocuń Marek (nocun@agh.edu.pl)
Module summary

Part I deals with the surface description. Part II consists of description of the different analytical techniques, while Part III deals with their application to various groups of materials.

Description of learning outcomes for module
MLO code Student after module completion has the knowledge/ knows how to/is able to Connections with FLO Method of learning outcomes verification (form of completion)
Social competence
M_K001 Acitivity during classes: following the lectures and readiness to formulate questions Activity during classes
M_K002 Presentation: skills concerning the preparation of presentation and ability of delivering the public presentation Presentation
Skills
M_U001 Participation in discussion: ability to participate in discussion on scientific topics related to the content of lectures and seminars Presentation
M_U002 Final test Test
M_U003 Presentation on scientific topic Presentation
Knowledge
M_W001 Application of surface analytical methods to various fields of materials science
FLO matrix in relation to forms of classes
MLO code Student after module completion has the knowledge/ knows how to/is able to Form of classes
Lecture
Audit. classes
Lab. classes
Project classes
Conv. seminar
Seminar classes
Pract. classes
Zaj. terenowe
Zaj. warsztatowe
Others
E-learning
Social competence
M_K001 Acitivity during classes: following the lectures and readiness to formulate questions + - - - - + - - - - -
M_K002 Presentation: skills concerning the preparation of presentation and ability of delivering the public presentation - - - - - + - - - - -
Skills
M_U001 Participation in discussion: ability to participate in discussion on scientific topics related to the content of lectures and seminars + - - - - + - - - - -
M_U002 Final test - - - - - - - - - - -
M_U003 Presentation on scientific topic - - - - - + - - - - -
Knowledge
M_W001 Application of surface analytical methods to various fields of materials science + - - - - + - - - - -
Module content
Lectures:
Methods of surface and thin films analysis: description

I. Ideal and real surfaces (in brief)
1. General description
2. Thermodynamics of surfaces
3. The structure of surfaces
4. Molecular and mechanical description of surfaces
5. Surface dynamics
6. Electrical properties of surfaces

II. Methods of surface investigation
7. Concept of selvedge
8. General description of the concept and approach
9. Interaction of the particles/radiation with matter: application to surface investigation
10. Parameters of surface methods
11. Electron spectroscopies: XPS (X-ray Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy, SAM (Scanning Electron Microscopy)
12. Scattered Ion Mass Spectrometry of light ions: RBS (Rutherford Backscattering Spectrometry), ISS (Ion Scattered Spectrometry)
13. Ion-Beam Mass Spectrometry – emitted ions: SIMS (Secondary Ion Mass Spectrometry), SNMS (Sputtered Neutrals Mass Spectrometry)
14. Scanning Probe Microscopy (SPM): STM (Scanning Tunnelling Microscopy), AFM (Atomic Force Microscopy), other
15. SEM (Scanning Electron Microscopy)
16. TEM (Transmission Electron Microscopy)
17. Sample preparation methods to electron microscopy studies (FIB, ion-beam thinning, …)
18. Raman Spectroscopy and Surface Enhanced Raman Spectroscopy (SERS)
19. Glow Discharge Optical Emission Spectroscopy (GDOES)
20. Grazing Incidence X-Ray Methods

III. Selection of the experimental methods: rules and examples (strategy and tactics)

Seminar classes:
Methods of surface and thin films analysis: applications

Applications: examples of application of various methods to surface and thin film analysis and solving the problems
Examples:
1. Characterization of Carbon Nanotubes and Other Related Structures
2. Characterization of Nanowires
3. Characterization of Graphene and Other Monolayer Structures
4. Surface Analysis of Polymers
5. Characterization of Catalysts
6. Characterization of Various Thin Films, Coatings and Coating-Substrate Systems Steel
7. Characterization of Thermally Grown Oxides

Student workload (ECTS credits balance)
Student activity form Student workload
Summary student workload 105 h
Module ECTS credits 4 ECTS
Examination or Final test 20 h
Participation in lectures 20 h
Participation in seminar classes 10 h
Preparation of a report, presentation, written work, etc. 30 h
Preparation for classes 25 h
Additional information
Method of calculating the final grade:

Presentation (50%) and Final test (50%)

Prerequisites and additional requirements:

Prerequisites and additional requirements not specified

Recommended literature and teaching resources:

G. Friedbacher, H. Bubert (Ed.), Surface and Thin Films Analysis, Wiley-VCH Verlag GmbH KGaA,Weinheim, 2011
S. Myhra, J.C. Rivere, Characterization of Nanostructures, CRC Press, Taylor & Francis Group, Bova Raton, 2012
D.J. O’Connor, B.A. Sexton, R.St.C. Smart, Surface Analysis Methods in Materials Science, Springer, Berlin-Heidelberg, 2nd Ed., 2003
Y. Leng, Materials Characterization, Wiley & Sons (Asia), Singapore, 2008
D. Brandon, W.D. Kaplan, Microstructural Characterization of Materials, 2nd Edition, John Wiley & Sons Ltd., Chichester, 2008
J.A. Venables, Introduction to surface and thin film processes, Cambridge University Press, Cambridge, 2000
K.W. Kolasinski, Surface Science, 2nd Edition, Wiley & Sons, Chichester, 2008

Scientific publications of module course instructors related to the topic of the module:

1. J. Jedliński, J.L. Grosseau Poussard, G. Smoła, G. Bonnet, M. Nocuń, K. Kowalski, and J. Dąbek, “The effect of alloyed and/or implanted yttrium on the mechanism of the scale development on β-NiAl at 1100oC”, Materials at High Temperatures, 29 (2), 59-69 (2012)
2. J. Jedlinski, J.L. Grosseau-Poussard, M. Nocuń, G. Smoła, K. Kowalski, J. Dąbek, A. Rakowska, G. Bonnet
“The Early Stages of the Scale Growth on FeCrAl(RE)-Type Alumina Formers”
Materials Science Forum, 696, 70-75 (2011)
3. J. Jedliński, J.L. Grosseau-Poussard
„Zastosowanie spektroskopii fotoluminescencyjnej w badaniu zgorzelin tlenkowych narastających na materiałach z grupy alumina formers”
Ochrona przed korozją, 54 (2011) 308-310
4. H.J. Choi, J. Jedlinski, B. Yao, Y.H. Sohn
“Transmission electron microscopy observations on the phase composition and microstructure of the oxidation scale grown on as-polished and yttrium-implanted β-NiAl”
Surface & Coatings Technology, 205 (2010) 1206–1210
5. J. Jedlinski
“Application of 18O2 Exposure–Based Approach to Study the Failure Mechanisms of Oxide Scales on Alumina Formers”
Materials Science Forum, 513 (2006) 149-164
6. J. Jedliński, A. Bernasik, K. Kowalski and M. Nocun
“On the Application of SIMS to Study the Oxidation Behaviour of Alumina Formers”
Materials at High Temperatures, 22 (2005) 505-520
7. J. Jedliński
“Local and Microstructure-related Effects Affecting the High Temperature Oxidation of Alumina Formers: A Brief Survey”
Materials at High Temperatures, 22 (2005) 485-496
8. M. Nocuń, J. Jedliński, E. Leja
“Spectroscopic studies of hybrid glasses based on TEOS-cyclosiloxane systems”
Proc. XXth International Congress on Glass, Kyoto, 27.09-1.10.2004, Paper : P-11-031
9. J. Jedliński, M. Konopka, M. Goebel, A. Glazkov, A. Bernasik, M. Nocun, J. Camra, G. Borchardt
“The Use of XPS and SIMS in Studying the Early Oxidation Stages of FeCrAl-Based High Temperature Alloys”
Proc. 7th European Conference on Applications of Surface and Interface Analysis, ECASIA’97, Göteborg, 1997, Ed. I. Olefjord, L. Nyborg, D. Briggs, J. Wiley & Sons, Chichester, 1997, p. 259 – 262
10. K. Kowalski, A. Bernasik, A. Sadowski, J. Janowski, M. Radecka, J. Jedliński
“SIMS Investigation of Titanium Diffusion in Yttria Stabilised Zirconia”
Proc. 7th European Conference on Applications of Surface and Interface Analysis, ECASIA’97, Göteborg, 1997, Ed. I. Olefjord, L. Nyborg, D. Briggs, J. Wiley & Sons, Chichester, 1997, p. 259 – 262
11. A. Bernasik, K. Kowalski, A. Sadowski, J. Janowski, J. Jedliński
“XPS Study of the Surface Segregation in Yttria Stabilised Zirconia”
Proc. 7th European Conference on Applications of Surface and Interface Analysis, ECASIA’97, Göteborg, 1997, Ed. I. Olefjord, L. Nyborg, D. Briggs, J. Wiley & Sons, Chichester, 1997, p. 255 – 258
12. J. Jedliński, A. Glazkov, M. Konopka, G. Borchardt, E. Tscherkasova, M. Bronfin, M. Nocun
“An XPS/SEM/EDX study of the early oxidation stages of Fe19Cr5Al (Y) alumina-forming alloys at 1173 K"
Applied Surface Science, 103, 205 – 216 (1996)

Additional information:

None