Module also offered within study programmes:
General information:
Name:
Advanced Methods of Electron Microscopy
Course of study:
2019/2020
Code:
ZSDA-3-0077-s
Faculty of:
Szkoła Doktorska AGH
Study level:
Third-cycle studies
Specialty:
-
Field of study:
Szkoła Doktorska AGH
Semester:
0
Profile of education:
Academic (A)
Lecture language:
English
Form and type of study:
Full-time studies
Course homepage:
 
Responsible teacher:
dr Kryshtal Oleksandr (kryshtal@agh.edu.pl)
Dyscypliny:
Moduł multidyscyplinarny
Module summary

The course focuses on practical aspects of electron microscopy (EM) studies of a vast range of materials. The lectures refresh the basics followed by a discussion of more advanced topics of the EM. The practical sessions are to demonstrate various TEM techniques and provide the students with the opportunity to work with the most advanced electron microscopes currently available. Intensive image analysis, simulation, and data processing will be supported by freeware software and open databases.

Description of learning outcomes for module
MLO code Student after module completion has the knowledge/ knows how to/is able to Connections with FLO Method of learning outcomes verification (form of completion)
Skills: he can
M_U001 Is able to select the appropriate method for characterization of various materials. SDA3A_U06, SDA3A_U02, SDA3A_U01 Report on completion of a practical placement,
Participation in a discussion,
Involvement in teamwork,
Execution of exercises,
Execution of a project,
Activity during classes
M_U002 Has basic skills of operation of advanced scanning and transmission electron microscope in different modes. SDA3A_U07, SDA3A_U06 Involvement in teamwork,
Execution of exercises,
Execution of a project
M_U003 Can understand and interpret electron microscopy images, diffraction patterns, EDX and EELS spectra SDA3A_U06, SDA3A_U03, SDA3A_U02, SDA3A_U01 Execution of exercises,
Execution of a project,
Report on completion of a practical placement,
Participation in a discussion,
Involvement in teamwork,
Activity during classes
Knowledge: he knows and understands
M_W001 Knows main electron microscopy techniques for materials characterization and understands what kind of information is possible to obtain from their use SDA3A_W03, SDA3A_W02, SDA3A_W01 Report on completion of a practical placement,
Participation in a discussion,
Examination,
Activity during classes
M_W002 Knows the major processes of electron-matter interaction and their relation to the microscopy techniques SDA3A_W01 Participation in a discussion,
Execution of exercises,
Execution of a project,
Activity during classes
M_W003 Understands the basics of electron microscopy, electron diffraction, and chemical composition microanalysis SDA3A_W03, SDA3A_W02, SDA3A_W01 Participation in a discussion,
Execution of exercises,
Activity during classes
Number of hours for each form of classes:
Sum (hours)
Lecture
Audit. classes
Lab. classes
Project classes
Conv. seminar
Seminar classes
Pract. classes
Zaj. terenowe
Zaj. warsztatowe
Prace kontr. przejść.
Lektorat
60 30 30 0 0 0 0 0 0 0 0 0
FLO matrix in relation to forms of classes
MLO code Student after module completion has the knowledge/ knows how to/is able to Form of classes
Lecture
Audit. classes
Lab. classes
Project classes
Conv. seminar
Seminar classes
Pract. classes
Zaj. terenowe
Zaj. warsztatowe
Prace kontr. przejść.
Lektorat
Skills
M_U001 Is able to select the appropriate method for characterization of various materials. + + - - - - - - - - -
M_U002 Has basic skills of operation of advanced scanning and transmission electron microscope in different modes. - + - - - - - - - - -
M_U003 Can understand and interpret electron microscopy images, diffraction patterns, EDX and EELS spectra + + - - - - - - - - -
Knowledge
M_W001 Knows main electron microscopy techniques for materials characterization and understands what kind of information is possible to obtain from their use + + - - - - - - - - -
M_W002 Knows the major processes of electron-matter interaction and their relation to the microscopy techniques + - - - - - - - - - -
M_W003 Understands the basics of electron microscopy, electron diffraction, and chemical composition microanalysis + + - - - - - - - - -
Student workload (ECTS credits balance)
Student activity form Student workload
Summary student workload 157 h
Module ECTS credits 6 ECTS
Udział w zajęciach dydaktycznych/praktyka 60 h
Preparation for classes 20 h
przygotowanie projektu, prezentacji, pracy pisemnej, sprawozdania 30 h
Realization of independently performed tasks 20 h
Examination or Final test 2 h
Contact hours 5 h
Inne 20 h
Module content
Lectures (30h):
  1. Basics of electron microscopy

    a. Electrons vs light. Resolution. Low and high order aberrations.
    b. Electron optics. Aberration correctors. Wiener filter.
    c. Electron – matter interactions

  2. Scanning electron microscopy (SEM)

    a. Optics of the SEM
    b. Image contrast
    c. Ultimate resolution in SEM
    d. Low voltage and environmental SEM
    e. EBSD
    f. EDX in SEM
    g. FIB-SEM tomography

  3. Transmission electron microscopy (TEM)

    a. Specimen preparation for TEM
    b. Optics of the TEM
    c. Electron diffraction (SAED, nano, CBED, precession)
    d. Contrast mechanisms
    e. HR TEM. Contrast transfer function.
    f. Image analysis in electron microscopy
    g. EELS and EFTEM
    h. In situ TEM

  4. Scanning transmission electron microscopy (STEM)

    a. Optics.
    b. Image contrast in STEM (BF, DF, Z-contrast)
    c. EDX in STEM
    d. EELS spectral imaging
    e. Electron tomography

Auditorium classes (30h):

1. SEM. Align, operation, image acquisition, and optimization. EDX. EBSD.
2. Indexing electron diffraction patters. Crystallographic structure databases.
3. Basic TEM. Align, operation, image contrast.
4. HR TEM. Contrast transfer function. Simulation of HR TEM images.
5. Basic STEM. BF, ADF, HAADF imaging.
6. HR STEM. Correction of aberrations. Simulation of HR STEM images.
7. Practical EDS microanalysis. EDX mapping of chemical elements.
8. Electron energy loss spectroscopy (EELS). Low- and core-loss spectra.
9. Tomography. Reconstruction of 3D images.
10. Image processing and data analysis.

Additional information
Teaching methods and techniques:
  • Lectures: Lecturing, class discussions
  • Auditorium classes: demonstrations, practice, group projects and discussions, self-learning, written reports.
Warunki i sposób zaliczenia poszczególnych form zajęć, w tym zasady zaliczeń poprawkowych, a także warunki dopuszczenia do egzaminu:

Students will be encouraged for writing and submitting a group/individual report from the classes.
Open-book final examination.

Participation rules in classes:
  • Lectures:
    – Attendance is mandatory: No
    – Participation rules in classes: Nie określono
  • Auditorium classes:
    – Attendance is mandatory: Yes
    – Participation rules in classes: Nie określono
Method of calculating the final grade:

Project Reports – 70%
Final Examination – 30%

Sposób i tryb wyrównywania zaległości powstałych wskutek nieobecności studenta na zajęciach:

individual project report

Prerequisites and additional requirements:

Basic knowledge of materials science.

Recommended literature and teaching resources:

1. Williams D., Carter C.B.: Transmission Electron Microscopy, Plenum Press, New York, 1996 and 2009 (vol. 1-4).
2. De Graef M.: “Introduction to conventional transmission electron microscopy”, Cambridge University Press 2003
3. Brydson R. (ed.): Aberration-Corrected Analytical Transmission Electron Microscopy, J. Wiley and Sons Ltd. 2011
4. Hawkes P.W., Spence J.C.H.: “Science of Microscopy”, Springer 2007
5. Keyse R.J., Garrat-Reed A.J., Goodhew P.J. and Lorimer G.W.: “Introduction to Scanning Transmission Electron Microscopy”, Taylor and Francis / BIOS Scientific Publishers, 1997

Scientific publications of module course instructors related to the topic of the module:

Additional scientific publications not specified

Additional information:

None