Module also offered within study programmes:
General information:
Name:
Advanced Methods of Surface and Thin Films Investigation
Course of study:
2019/2020
Code:
ZSDA-3-0133-s
Faculty of:
Szkoła Doktorska AGH
Study level:
Third-cycle studies
Specialty:
-
Field of study:
Szkoła Doktorska AGH
Semester:
0
Profile of education:
Academic (A)
Lecture language:
English
Form and type of study:
Full-time studies
Course homepage:
 
Responsible teacher:
prof. nadzw. dr hab. inż. Jedliński Jerzy (jedlinsk@agh.edu.pl)
Dyscypliny:
inżynieria biomedyczna, inżynieria chemiczna, inżynieria materiałowa, nauki chemiczne, nauki fizyczne
Module summary

The first part will define the object of interest which will rely on description of ideal and real surfaces as well as of thin films in terms of formal approaches and the most important properties. Subsequently, the approach aimed at characterization of surfaces and thin films will be outlined. Afterwards, the methods and their selection rules will be described. Seminar will complete lectures with more practical issues, in particular with application of the methods in research approaches.

Description of learning outcomes for module
MLO code Student after module completion has the knowledge/ knows how to/is able to Connections with FLO Method of learning outcomes verification (form of completion)
Knowledge: he knows and understands
M_W001 Description of ideal and real surfaces. SDA3A_K01, SDA3A_W03, SDA3A_W01, SDA3A_U02, SDA3A_U05 Activity during classes
M_W002 Description of thin films SDA3A_K01, SDA3A_W03, SDA3A_W02, SDA3A_U02, SDA3A_U05 Activity during classes
M_W003 Concepts of surface and thin films investigation SDA3A_K01, SDA3A_W03, SDA3A_W01, SDA3A_U02, SDA3A_U05, SDA3A_U01 Activity during classes
M_W004 Description of analytical methods for surface and thin films investigation SDA3A_K01, SDA3A_W03, SDA3A_W02, SDA3A_U02, SDA3A_U05, SDA3A_U01 Activity during classes
M_W005 Grasping the approach to selecting the analytical methods to research issues SDA3A_K01, SDA3A_W03, SDA3A_W02, SDA3A_U06, SDA3A_U05 Activity during classes
Number of hours for each form of classes:
Sum (hours)
Lecture
Audit. classes
Lab. classes
Project classes
Conv. seminar
Seminar classes
Pract. classes
Zaj. terenowe
Zaj. warsztatowe
Prace kontr. przejść.
Lektorat
30 18 0 0 0 0 12 0 0 0 0 0
FLO matrix in relation to forms of classes
MLO code Student after module completion has the knowledge/ knows how to/is able to Form of classes
Lecture
Audit. classes
Lab. classes
Project classes
Conv. seminar
Seminar classes
Pract. classes
Zaj. terenowe
Zaj. warsztatowe
Prace kontr. przejść.
Lektorat
Knowledge
M_W001 Description of ideal and real surfaces. + - - - - - - - - - -
M_W002 Description of thin films + - - - - - - - - - -
M_W003 Concepts of surface and thin films investigation + - - - - - - - - - -
M_W004 Description of analytical methods for surface and thin films investigation + - - - - + - - - - -
M_W005 Grasping the approach to selecting the analytical methods to research issues + - - - - + - - - - -
Student workload (ECTS credits balance)
Student activity form Student workload
Summary student workload 79 h
Module ECTS credits 4 ECTS
Udział w zajęciach dydaktycznych/praktyka 30 h
Preparation for classes 15 h
przygotowanie projektu, prezentacji, pracy pisemnej, sprawozdania 20 h
Realization of independently performed tasks 10 h
Examination or Final test 2 h
Contact hours 2 h
Module content
Lectures (18h):
  1. Ideal and real surfaces

    1. General description
    2. Thermodynamics of surfaces
    3. The structure of surfaces

  2. Thin films

    1. General description and manufacturing methods
    2. Examples

  3. Methods of surface and thin films investigation

    1. Concept of selvedge
    2. General description of the concept and approach
    3. Interaction of the particles/radiation with matter: application to surface investigation
    4. Parameters of surface methods
    5. Electron spectroscopies: XPS (X-ray Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy, SAM (Scanning Electron Microscopy)
    6. Scattered Ion Mass Spectrometry of light ions: RBS (Rutherford Backscattering Spectrometry), ISS (Ion Scattered Spectrometry)
    7. Ion-Beam Mass Spectrometry – emitted ions: SIMS (Secondary Ion Mass Spectrometry), SNMS (Sputtered Neutrals Mass Spectrometry)
    8. Scanning Probe Microscopy (SPM): STM (Scanning Tunnelling Microscopy), AFM (Atomic Force Microscopy), other
    9. Auxiliary methods:
    a. SEM (Scanning Electron Microscopy)
    b. TEM (Transmission Electron Microscopy)
    c. Sample preparation methods to electron microscopy studies (FIB, ion-beam thinning, …)

  4. Selection of the experimental methods

    1. Selection rules
    2. Examples

Seminar classes (12h):
  1. Ideal and real surfaces

    1. Molecular and mechanical description of surfaces
    2. Surface dynamics
    3. Electrical properties of surfaces

  2. Thin films in materials

    Surface processes in thin film devices

  3. Methods of surface and thin films investigation

    Examples of the application of surface and thin films analytical methods to materials science-related issues

Additional information
Teaching methods and techniques:
  • Lectures: Lectures with numerous practical examples and discussion
  • Seminar classes: Individual and team work on specific topics, discussions
Warunki i sposób zaliczenia poszczególnych form zajęć, w tym zasady zaliczeń poprawkowych, a także warunki dopuszczenia do egzaminu:

The activity of students as well as the quality of their work on specific topics (presentation or projects) will be assessed. If necessary: final test will be carried out.
Correction route will be tailored to the sort of backlogs.

Participation rules in classes:
  • Lectures:
    – Attendance is mandatory: No
    – Participation rules in classes: Non-obligatory
  • Seminar classes:
    – Attendance is mandatory: Yes
    – Participation rules in classes: Obligatory
Method of calculating the final grade:

Results of individual work (presentation and/or project) : 80%, activity: 20%

Sposób i tryb wyrównywania zaległości powstałych wskutek nieobecności studenta na zajęciach:

Individual approach, depending on the number and sort of classes missed

Prerequisites and additional requirements:

1. English skills enabling participation at classes
2. Knowledge relevant to master level of studies in: physics, chemistry, including crystallography, thermodynamics (reference: curricula of technological studies)

Recommended literature and teaching resources:

G. Friedbacher, H. Bubert (Ed.), Surface and Thin Films Analysis, Wiley-VCH Verlag GmbH KGaA,Weinheim, 2011
S. Myhra, J.C. Rivere, Characterization of Nanostructures, CRC Press, Taylor & Francis Group, Bova Raton, 2012
D.J. O’Connor, B.A. Sexton, R.St.C. Smart, Surface Analysis Methods in Materials Science, Springer, Berlin-Heidelberg, 2nd Ed., 2003
Y. Leng, Materials Characterization, Wiley & Sons (Asia), Singapore, 2008
K.W. Kolasinski, Surface Science, 2nd Edition, Wiley & Sons, 2008

Scientific publications of module course instructors related to the topic of the module:

1. J. Jedliński, J.L. Grosseau Poussard, G. Smoła, G. Bonnet, M. Nocuń, K. Kowalski, and J. Dąbek, “The effect of alloyed and/or implanted yttrium on the mechanism of the scale development on β-NiAl at 1100oC”, Materials at High Temperatures, 29 (2), 59-69 (2012)
2. J. Jedlinski, J.L. Grosseau-Poussard, M. Nocuń, G. Smoła, K. Kowalski, J. Dąbek, A. Rakowska, G. Bonnet
“The Early Stages of the Scale Growth on FeCrAl(RE)-Type Alumina Formers”
Materials Science Forum, 696, 70-75 (2011)
3. J. Jedliński, J.L. Grosseau-Poussard
„Zastosowanie spektroskopii fotoluminescencyjnej w badaniu zgorzelin tlenkowych narastających na materiałach z grupy alumina formers”
Ochrona przed korozją, 54 (2011) 308-310
4. H.J. Choi, J. Jedlinski, B. Yao, Y.H. Sohn
“Transmission electron microscopy observations on the phase composition and microstructure of the oxidation scale grown on as-polished and yttrium-implanted β-NiAl”
Surface & Coatings Technology, 205 (2010) 1206–1210
5. J. Jedlinski
“Application of 18O2 Exposure–Based Approach to Study the Failure Mechanisms of Oxide Scales on Alumina Formers”
Materials Science Forum, 513 (2006) 149-164
6. J. Jedliński, A. Bernasik, K. Kowalski and M. Nocun
“On the Application of SIMS to Study the Oxidation Behaviour of Alumina Formers”
Materials at High Temperatures, 22 (2005) 505-520
7. J. Jedliński
“Local and Microstructure-related Effects Affecting the High Temperature Oxidation of Alumina Formers: A Brief Survey”
Materials at High Temperatures, 22 (2005) 485-496
8. M. Nocuń, J. Jedliński, E. Leja
“Spectroscopic studies of hybrid glasses based on TEOS-cyclosiloxane systems”
Proc. XXth International Congress on Glass, Kyoto, 27.09-1.10.2004, Paper : P-11-031
9. J. Jedliński, M. Konopka, M. Goebel, A. Glazkov, A. Bernasik, M. Nocun, J. Camra, G. Borchardt
“The Use of XPS and SIMS in Studying the Early Oxidation Stages of FeCrAl-Based High Temperature Alloys”
Proc. 7th European Conference on Applications of Surface and Interface Analysis, ECASIA’97, Göteborg, 1997, Ed. I. Olefjord, L. Nyborg, D. Briggs, J. Wiley & Sons, Chichester, 1997, p. 259 – 262
10. K. Kowalski, A. Bernasik, A. Sadowski, J. Janowski, M. Radecka, J. Jedliński
“SIMS Investigation of Titanium Diffusion in Yttria Stabilised Zirconia”
Proc. 7th European Conference on Applications of Surface and Interface Analysis, ECASIA’97, Göteborg, 1997, Ed. I. Olefjord, L. Nyborg, D. Briggs, J. Wiley & Sons, Chichester, 1997, p. 259 – 262
11. A. Bernasik, K. Kowalski, A. Sadowski, J. Janowski, J. Jedliński
“XPS Study of the Surface Segregation in Yttria Stabilised Zirconia”
Proc. 7th European Conference on Applications of Surface and Interface Analysis, ECASIA’97, Göteborg, 1997, Ed. I. Olefjord, L. Nyborg, D. Briggs, J. Wiley & Sons, Chichester, 1997, p. 255 – 258
12. J. Jedliński, A. Glazkov, M. Konopka, G. Borchardt, E. Tscherkasova, M. Bronfin, M. Nocun
“An XPS/SEM/EDX study of the early oxidation stages of Fe19Cr5Al (Y) alumina-forming alloys at 1173 K"
Applied Surface Science, 103, 205 – 216 (1996)

Additional information:

None